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Nano Research

Article Title

Contactless probing of the intrinsic carrier transport in single-walled carbon nanotubes

Authors

Yize Stephanie Li, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China Present address: Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI 53706, USA Present address: Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
Jun Ge, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China Present address: Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI 53706, USA Present address: Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
Jinhua Cai, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China Present address: Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI 53706, USA Present address: Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
Jie Zhang, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China Present address: Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI 53706, USA Present address: Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
Wei Lu, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China Present address: Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI 53706, USA Present address: Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
Jia Liu, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China Present address: Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI 53706, USA Present address: Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
Liwei Chen, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China Present address: Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI 53706, USA Present address: Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA

Keywords

single-walled carbon nanotubes, electronic transport, dielectric force microscopy, field-effect transistor, carrier density, carrier mobility

Abstract

Intrinsic carrier transport properties of single-walled carbon nanotubes have been probed by two parallel methods on the same individual tubes: The contactless dielectric force microscopy (DFM) technique and the conventional field-effect transistor (FET) method. The dielectric responses of SWNTs are strongly correlated with electronic transport of the corresponding FETs. The DC bias voltage in DFM plays a role analogous to the gate voltage in FET. A microscopic model based on the general continuity equation and numerical simulation is built to reveal the link between intrinsic properties such as carrier concentration and mobility and the macroscopic observable, i.e. dielectric responses, in DFM experiments. Local transport barriers in nanotubes, which influence the device transport behaviors, are also detected with nanometer scale resolution.

Graphical Abstract

Publisher

Tsinghua University Press

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