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Nano Research

Article Title

Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials

Authors

Najme S. Taghavi, Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain; Faculty of Physics, Khaje Nasir Toosi University of Technology (KNTU), Tehrān 19697 64499, Iran;
Patricia Gant, Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain;
Peng Huang, Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain; State Key Laboratory of Tribology, Tsinghua University, Beijing 100084, China;
Iris Niehues, Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany
Robert Schmidt, Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany
Steffen Michaelis de Vasconcellos, Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany
Rudolf Bratschitsch, Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany
Mar García-Hernández, Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain;
Riccardo Frisenda, Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain;
Andres Castellanos-Gomez, Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain;

Keywords

transition metal dichalcogenides, optical identification, transparent substrate, trasmittance

Abstract

Here, we propose a method to determine the thickness of the most common transition metal dichalcogenides (TMDCs) placed on the surface of transparent stamps, used for the deterministic placement of two-dimensional materials, by analyzing the red, green and blue channels of transmission-mode optical microscopy images of the samples. In particular, the blue channel transmittance shows a large and monotonic thickness dependence, making it a very convenient probe of the flake thickness. The method proves to be robust given the small flake-to-flake variation and the insensitivity to doping changes of MoS2. We also tested the method for MoSe2, WS2 and WSe2. These results provide a reference guide to identify the number of layers of this family of materials on transparent substrates only using optical microscopy.

Graphical Abstract

Publisher

Tsinghua University Press

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