Nanoscopic imaging of oxidized graphene monolayer using tip-enhanced Raman scattering
graphene, Raman spectroscopy, tip-enhanced Raman scattering, graphene oxidation
ABSTRACT Tip-enhanced Raman scattering (TERS) can be used for the structural and chemical characterization of materials with a nanoscale resolution, and offers numerous advantages compared to other forms of imaging. We use TERS to track the local structural features of a CVD-grown graphene monolayer. Ag nanoparticles were added to AFM probes using ion-beam sputtering in order to make them TERS-active. Such modification provides probes with large factors of enhancement and good reproducibility. TERS measurements on graphene show an emergence of a defect-induced D-Raman band and a strain-induced shoulder of the graphene’s G-band. Comparison of TERS results with micro-Raman for oxidized graphene suggests that local oxidation occurs with the introduction of sp3 defects, under TERS conditions.
Tsinghua University Press
Joseph M. Smolsky,Alexey V. Krasnoslobodtsev, Nanoscopic imaging of oxidized graphene monolayer using tip-enhanced Raman scattering. NanoRes.2018, 11(12): 6346–6359