Scanning electron microscopy imaging of single-walled carbon nanotubes on substrates
single-walled carbon nanotube, scanning electron microscopy, imaging, surface charging
ABSTRACT Scanning electron microscopy (SEM) plays an indispensable role in nanoscience and nanotechnology because of its high efficiency and high spatial resolution in characterizing nanomaterials. Recent progress indicates that the contrast arising from different conductivities or bandgaps can be observed in SEM images if single-walled carbon nanotubes (SWCNTs) are placed on a substrate. In this study, we use SWCNTs on different substrates as model systems to perform SEM imaging of nanomaterials. Substantial SEM observations are conducted at both high and low acceleration voltages, leading to a comprehensive understanding of the effects of the imaging parameters and substrates on the material and surface-charge signals, as well as the SEM imaging. This unified picture of SEM imaging not only furthers our understanding of SEM images of SWCNTs on a variety of substrates but also provides a basis for developing new imaging recipes for other important nanomaterials used in nanoelectronics and nanophotonics.
Tsinghua University Press
Dongqi Li,Jin Zhang,Yujun He,Yan Qin,Yang Wei,Peng Liu,Lina Zhang,Jiaping Wang,Qunqing Li,Shoushan Fan,Kaili Jiang, Scanning electron microscopy imaging of single-walled carbon nanotubes on substrates. NanoRes.2017, 10(5): 1804–1818